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The Development Process of an SPI Chip on FPGA for Driving Embedded Devices

The Development Process of an SPI Chip on FPGA for Driving Embedded Devices

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Course Duration
Approx 10

Course Price
₹ 14000

Course Level
Beginner

Course Content

The Development Process of an SPI Chip on FPGA for Driving Embedded Devices

Abstract

Long Range Ultrasonic Testing (LRUT) is an emerging ultrasound Non-destructive Testing (NDT) method. The LRUT is a variant of the conventional NDT approach. By using ultrasound guided waves (UGWs) , it is efficient in quick long range defect scanning, which is impossible with other traditional NDT techniques. Increasing numbers of requirements for quick long range testing have led to urgent need for the improvement of testing methods and the development of new testing equipment to help researchers in laboratory and help technicians in field inspection.

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